Design for testability is a design technique that modifies a chip such that the testing process becomes easier and more cost-effective by adding extra circuitry to the chip. With the help of DFT techniques, the controllability and observability of the internal fault nodes are improved. This is where the industry needs test engineers who can generate test vectors after the design is completed. But this approach will consume a substantial amount of time and effort that could be avoided if testing is considered at an early phase in the design flow (i.e.) Integration of design & test called DFT.

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